604 Harmony Lane
Pleasantville, CA 94588
Electrical Engineer with experience in Computer Technology.
AREAS OF EXPERTISE
• VLSI Design • Control Engineering
• Digital Signal Processing • Digital Design
• Network Analysis • Random Signal & Noise
• Semiconductor Devices • Industrial Electronics
• TCP/IP • Computer Architecture
• Electrical Circuits • LAN
Zane Company, Fremont, CA
2000 - Present
Responsible for PCB board-level functional testing, troubleshooting, and testing process and instruction configuration. Perform ICT test of DSL boards; burn-in test of Sun Microsystems motherboards; power module final diagnostic test of Intel CPUs; burn-in test of Xilinx BIOS; and test of high-end 3DFX graphic accelerators.
• Model SL120 Tadpole Cycle Computer motherboard based on Sun Microsystems architecture: 72-hour burn-in test with Sun Solaris 5 Operating System.• Acu Comm Internet Communications iDAC/iRacer/iModule Internet Router Simulation System with base and terminal: Data transmission length test to analyze failure signal.
• Quantum 3D AAlchemy 8164 High-end Graphic Accelerator, with 8 on-board 3DFX chip units: Xilinx BIOS burn-in test and PCB troubleshoot.
• Vina Tech E-Link 200/208/216 network product (Combines T1, Ethernet, and RS232): Data connection analysis between channels and IC controllers.
• Pycon PLB308 Power Module for Intel Pentium III/IV CPU core voltage test: Final diagnostic and voltage adjustment.
• Adastra ATX/ETX PCB Casino Data System motherboard and extension: Troubleshoot on-board BGA, AGP, and PCI interface.
EDUCATION AND TRAINING
International Technology University, Santa Clara, CA
MSEE, International Technology University, Santa Clara, CA
BSEE, National Taipei Institute of Technology, Taipei, Taiwan
In-Circuit Testing course with HP/Agilent 3070 Series II
Flying Probe Testing course with GenRad GR Pilot LX and GenRad's GR Alchemist III software suite
RELATED ACADEMIC PROJECTS
Avalanche Breakdown Voltages of Abrupt and Linearly Graded P-N Junctions.
- Performed general analysis of space charge, electric field, and potential distribution in Ge, Si, GaAs, and GaP.
Numerical Analysis for The Linearly Graded P-N Junction.
- Conducted fundamental analysis specified by Poisson's and time independent continuity equation.
Bipolar Transistor Model for Computer Simulation.
- Used Gummel-Poon model to obtain result of second-order effects on bipolar transistor characteristics in active mode.
TAP Controller State Machine using Verilog HDL.
- Wrote behavior model of TAP controller finite state machine, and created test bench to exercise all functions.
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